Coupled XRF and XRD analyses for rapid and low-cost characterization of geological materials in the mineral exploration and mining industry

Uvarova, Y.A.; Cleverley, J.S.; Baensch, A.; Verrall, M.

doi:10.70499/imtj3814

Association of
Applied Geochemists

Science article EXPLORE 162 · March 2014

Coupled XRF and XRD analyses for rapid and low-cost characterization of geological materials in the mineral exploration and mining industry

Y.A. Uvarova , J.S. Cleverley, A. Baensch, M. Verrall

Published in: EXPLORE issue 162, March 2014, pages 1 to 14
DOI: https://doi.org/10.70499/imtj3814
Publisher: Association of Applied Geochemists

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Uvarova, Y. A., Cleverley, J. S., Baensch, A., & Verrall, M. (2014). Coupled XRF and XRD analyses for rapid and low-cost characterization of geological materials in the mineral exploration and mining industry. EXPLORE, 162, 1–14. https://doi.org/10.70499/imtj3814

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